4 terms

Scanning Probe microscopy

STUDY
PLAY
Images
At the atomic level!
Types
Scanning tunnel and atomic force
STM
Tungsten probe hovers over specimen while electric voltage applied; current strength dependent distance from tip to specimen; electric signal transmitted to computer to create image
AFM
Probe scans contour of specimen surface at atomic level; various forces btw probe and specimen measured with a laser and transmitted to computer
YOU MIGHT ALSO LIKE...